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A: Fachverband Atomphysik
A 22: Highly Charged Ions and their Applications I
A 22.5: Vortrag
Mittwoch, 13. März 2024, 15:30–15:45, HS 1098
S-EBIT II, first commissioning results — •Tino Morgenroth1,2,3, Sonja Bernitt1,2,3, Rex Simon1,2,3, Sergiy Trotsenko2, Reinhold Schuch1,4, and Thomas Stöhlker1,2,3 — 1Helmholtz Institute Jena, 07743 Jena, Germany — 2GSI Helmholtzzentrum für Schwerionenforschung GmbH, 64291 Darmstadt, Germany — 3IOQ, Friedrich-Schiller-University Jena, 07743 Jena, Germany — 4Department of Physics, Stockholm University, 106 91 Stockholm, Sweden
The demand for beamtime at GSI facilities like ESR, CRYRING or HITRAP has increased over the last years and can not be fully covered by the GSI accelerator infrastructure. Local ion sources play an important role in closing this gap and allowing for *offline operation* of experiments at GSI.
Electron Beam Ion Traps (EBITs) are widely known as a versatile tool for spectroscopic studies of partially ionized atomic systems. Furthermore, they can be used as small stand-alone ion sources, capable of producing beams of heavy highly-charged ions of a certain charge state at reasonable intensities.
The S-EBIT II is currently under commissioning for operation as a facility for x-ray spectroscopy and as a standalone ion source for HITRAP. This will provide new opportunities for local experiments independently from the GSI accelerator infrastructure. Examples are the ARTEMIS experiment and the upcoming cryogenic paul trap for quantum logic spectroscopy. As a first step towards completing commissioning, we carried out DR measurements with argon.
Keywords: EBIT; Dielectronic Recombination; GSI; HITRAP; Spectroscopy