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A: Fachverband Atomphysik
A 25: Poster IV
A 25.12: Poster
Mittwoch, 13. März 2024, 17:00–19:00, Tent A
Polarization Phenomena of Compton Scattering in the Hard X-Ray Regime Revealed by Compton Polarimetry — •Tobias Over1,2,3, Alexandre Gumberidze1, Marc O. Herdrich2,3, Thomas Krings4, Wilko Middents1,2,3, Philip Pfäfflein1,2,3, Uwe Spillmann1, Günter Weber1,2, and Thomas Stöhlker1,2,3 — 1GSI GmbH, Planckstraße 1, 64291 Darmstadt — 2HI Jena, Fröbelstieg 3, 07743 Jena — 3FSU Jena, Leutragraben 1, 07743 Jena — 4FZ Jülich, Wilhelm-Johnen-Straße, 52425 Jülich
For photon energies from several tens of keV up to a few MeV, Compton polarimetry is an indispensable tool to gain insight into subtle details of fundamental radiative processes in atomic physics. Within the SPARC collaboration several segmented semiconductor detectors have been developed that are well suited for application as efficient Compton polarimeters. For electron-photon and photon-photon scattering processes in the hard x-ray regime these kind of detectors enable revealing photon polarization effects in great detail. Particular emphasis is given to processes common in astrophysical objects. For processes such as radiative recombination, electron bremsstrahlung, Rayleigh and Compton scattering where spin-effects and polarization transfer phenomena are of great importance. In our presentation, an overview of recent results obtained for inelastic scattering in the hard x-ray regime as well as ongoing experimental projects will be presented. In particular, we will discuss the extension to photon energies of several hundreds of keV, using a novel Compton telescope detector.