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A: Fachverband Atomphysik
A 31: Atomic Systems in External Fields II
A 31.8: Vortrag
Donnerstag, 14. März 2024, 16:15–16:30, HS 1015
Compton polarimetry of elastic scattering of highly linearly polarized hard x-rays — •Wilko Middents1,2,3, Günter Weber1,2, Alexandre Gumberidze2, Thomas Krings4, Tobias Over1,2,3, Philip Pfäfflein1,2,3, Uwe Spillmann2, and Thomas Stöhlker1,2,3 — 1Helmholtz-Institut Jena, Fröbelstieg 3, 07743 Jena — 2GSI GmbH, Planckstraße 1, 64291 Darmstadt — 3FSU Jena, Leutragraben 1, 07743 Jena — 4FZ Jülich, Wilhelm-Johnen-Str., 52425 Jülich
Elastic scattering of photons off matter is a fundamental light-matter interaction process. Precise polarization-dependent measurements provide a sensitive test of the underlying theory. For photon energies from several tens of keV up to a few MeV, efficient polarimetry is based on the polarization-sensitive pattern of Compton scattering.
I will report on the technique of Compton polarimetry in the hard x-ray regime via detectors based on a double-sided segmented semiconductor crystal [1]. Furthermore, I will show the results of an experiment on the polarization transfer in elastic scattering of 175 keV x-rays off a gold target and provide an outlook on future possibilities for polarization measurements of elastic scattering.
[1] Vockert, M. et al., (2017), NimB 313-316. https://doi.org/10.1016/j.nimb.2017.05.035
Keywords: Elastic Scattering; Compton Polarimetry; Polarization; Rayleigh Scattering