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Q: Fachverband Quantenoptik und Photonik
Q 37: Poster III
Q 37.27: Poster
Wednesday, March 13, 2024, 17:00–19:00, Tent B
Progress towards a fault tolerant microwave-driven two qubit quantum processor — •Hardik Mendpara1,2, Nicolas Pulido-Mateo1,2, Markus Duwe1,2, Alexander Onkes1,2, Ludwig Krinner1,2, and Christian Ospelkaus1,2 — 1Institut für Quantenoptik, Leibniz Universität Hannover, Hannover — 2Physikalisch-Technische Bundesanstalt, Braunschweig
A universal quantum gate set can be realized by the combination of single-qubit gates and one entangling operation. Here, we realize such a universal gate-set using the microwave near-field approach [1]. We trap 9Be+ ions in a surface electrode trap and perform the quantum logic operations with embedded electrodes. The individual qubits are addressed by micromotion sidebands [2] and the entangling gate is performed via a Mølmer-Sørensen type interaction. We approach an infidelity of 10−3 with entangling gates using partial state tomography and in a computational context we extract a composite process infidelity of 3.4(4)×10−2 using the cycle benchmarking protocol [4]. We report on recent progress on improving the gate fidelities and characterizing the quantum process errors.
[1] C. Ospelkaus et al., Phys. Rev. Lett. 9, 090502 (2008)
[2] U. Warring et al., Phys. Rev. Lett. 17, 173002 (2013)
[3] M. Duwe et al., Quantum Sci. Technol. 7, 045005 (2022)
[4] N. Pulido-Mateo et al., Manuscript in preparation
Keywords: trapped-ions; quantum information; randomized benchmarking; cycle benchmarking