Bonn 2025 – wissenschaftliches Programm

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A: Fachverband Atomphysik

A 37: Poster – Highly Charged Ions and their Applications

A 37.6: Poster

Donnerstag, 13. März 2025, 17:00–19:00, Tent

Generation of Highly Charged Ions with a miniEBIT — •Finja Mayer, Stepan Kokh, Melina Gizewski, Yang Yang, Nadir Khan, Moto Togawa, Thomas Pfeifer, José R. Crespo López-Urrutia, and Vera M. Schäfer — Max-Planck-Institut für Kernphysik, Heidelberg

Is the fine structure constant really constant? The answer to this question calls for physical systems that are highly sensitive to potential variations of α over time. Particularly interesting are highly charged ions, since their energy levels and thus measurable atomic transition frequencies are subject to enhanced relativistic shifts, making them more sensitive to variations of α. However, the generation of HCIs is difficult, because the removal of electrons necessitates increasingly greater amounts of energy with increasing charge number of the ion. As a solution, the Electron Beam Ion Trap (EBIT) ionises injected atoms with accelerated electrons that are collimated by a strong magnetic field. The electromagnetic potential of the electron beam and several electrodes then confine these ions within the trap, thus allowing for higher charge states to be reached. This poster focusses on the precise structure of the EBIT, the design considerations involved, and the techniques used for construction.

Keywords: Generation of HCIs; Ion Trap; construction