Bonn 2025 – scientific programme
Parts | Days | Selection | Search | Updates | Downloads | Help
A: Fachverband Atomphysik
A 39: Highly Charged Ions and their Applications
A 39.8: Talk
Friday, March 14, 2025, 12:45–13:00, KlHS Mathe
Experiments on Highly Charged Ions from S-EBIT II — •Rex Simon1,2,3, Tino Morgenroth1,2,3, Sonja Bernitt1,2, Sergiy Trotsenko2, Reinhold Schuch2,4, and Thomas Stöhlker1,2,3 — 1Helmholtz Institute Jena, 07743 Jena, Germany — 2GSI Helmholtzzentrum für Schwerionenforschung GmbH, 64291 Darmstadt, Germany — 3IOQ, Friedrich-Schiller-University Jena, 07743 Jena, Germany — 4Department of Physics, Stockholm University, 10691 Stockholm, Sweden
Electron Beam Ion Traps (EBITs) are versatile tools for investigating electron-ion interactions. Dielectronic recombination (DR) is a critical process that governs the ion charge-state equilibria in hot plasmas, with implications for theoretical models and plasma diagnostics [1]. Facilities such as CRYRING, ESR, and HITRAP [2] at GSI rely heavily on a steady supply of ions for experimental research. However, the dependence on the GSI accelerator limits operational flexibility, S-EBIT II emerged as a promising candidate to address this challenge, offering to be a local ion source for HITRAP and a standalone functionality for diverse experimental setups. By enabling local experiments such as ARTEMIS, and supporting advanced research into highly charged ion interactions, DR processes, and X-ray spectroscopy. Recent commissioning efforts include DR measurements with argon, alongside ongoing improvements to the electron gun and preparing to attach S-EBIT II to HITRAP. References [1] Beilmann, C. et al., 2013, Phys. Rev. A, 88(6), 062706. [2] H.-J. Kluge et al., 2008, Progress in Particle and Nuclear Physics, 59, 100-115.
Keywords: Electron Beam Ion Traps; Highly Charged Ions; Dielectronic recombination