Bonn 2025 – wissenschaftliches Programm
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MO: Fachverband Molekülphysik
MO 15: Interaction with VUV and X-ray Light I (joint session A/MO)
MO 15.6: Vortrag
Mittwoch, 12. März 2025, 12:15–12:30, GrHS Mathe
Cavity-controlled X-ray emission spectra — •Shu-Xing Wang1, 2, Xin-Chao Huang3, Zhe-Qian Zhao4, Xi-Yuan Wang4, and Lin-Fan Zhu4 — 1I. Physikalisches Institut, Justus-Liebig-Universität Gießen, 35392 Giessen, Germany — 2Helmholtz Forschungsakademie Hessen für FAIR (HFHF), GSI Helmholtzzentrum für Schwerionenforschung, Campus Gießen, 35392 Giessen, Germany — 3FXE instrument, European XFEL, Schenefeld 22869, Germany — 4University of Science and Technology of China, Hefei, 230026, China
We report on the X-ray emission spectra from a thin-film cavity sample, measured using a von Hamos spectrometer at the GALAXIES beamline of the SOLEIL synchrotron radiation facility in Paris. The cavity consists of a multilayer structure: 21.8 nm Pt / 203.3 nm C / 29.4 nm WSi2 / 201.0 nm C / 144.6 nm Pt, deposited on a silicon substrate. X-ray emission spectra covering the Lα emission lines of W were recorded by scanning the incident X-ray energy across 10160-10240 eV (L3 edge of W) at grazing angles near the first cavity mode. Our measurements reveal the collective Lamb shift and superradiant enhancement associated with the inner-shell transition. Notably, by concentrating on the resonant X-ray emission channel, we suppress the influence of the absorption edge, which might otherwise obscure the observed quantum optical effects.
Keywords: thin-film cavity; synchrotron radiation; inner-shell excitation; x-ray emission spectra