Bonn 2025 – scientific programme
Parts | Days | Selection | Search | Updates | Downloads | Help
QI: Fachverband Quanteninformation
QI 36: Poster – Quantum Information (joint session QI/Q)
QI 36.20: Poster
Thursday, March 13, 2025, 17:00–19:00, Tent
Surface-electrode ion trap testing apparatus for the QTZ at PTB — •Marco Bonkowski1, Sebastian Halama1, and Christian Ospelkaus1,2 — 1Leibniz Universität Hannover, Institut für Quantenoptik, Welfengarten 1, 30167 Hannover — 2Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig
One of the main challenges in performing useful quantum computations outside of purely academic interest is the need for a higher number of high-fidelity qubits. Surface-electrode ion traps have the potential to be a suitable solution for this scalability problem. [1] The ongoing research in this field often requires complicated, expensive setups and highly trained personnel which proves to be challenging for smaller facilities. The quantum technology competence center (QTZ) at the Physikalisch-Technische Bundesanstalt will support the industrial development of quantum technology by providing the necessary infrastructure to test and characterize quantum components such as ion traps. Our group has developed a cryogenic ion trap apparatus for trap testing that was first set up at the LUH and will be used to verify the results of the QuMIC project and then will be transferred to the QTZ. Within the QuMIC project highly integrated BiCMOS chips are developed and used for the microwave generation in the microwave near-field approach [2] to control the qubits. We describe the setup of the apparatus and the associated laser system for trapping beryllium ions.
[1] Chiaverini et al., Quantum Inf Comput 5, 419-439 (2005)
[2] Ospelkaus et al., Phys. Rev. Lett. 101, 090502 (2008)
Keywords: Surface-electrode ion trap; Cryogenic ion trap apparatus; Quantum computer