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T: Fachverband Teilchenphysik
T 6: Silicon Detectors II (Belle II, Tristan)
T 6.4: Vortrag
Montag, 31. März 2025, 17:30–17:45, VG 1.101
Investigation of TID damage in the Drain Current Digitizer chip of the Belle II Pixel Detector — •Nikolas Pässler, Jannes Schmitz, Georgios Giakoustidis, Jochen Dingfelder, and Florian Bernlochner — University of Bonn, Physikalisches Institut, Nußallee 12, 53115 Bonn, Germany
The Belle II experiment at the SuperKEKB collider in Tsukuba, Japan, explores e+ e− collisions at a center-of-mass energy of 10.58 GeV and achieved a record luminosity of 4.7 · 1034 cm−2 s−1. During the Long Shutdown 1 (LS1) from 2022 to 2023, the initial partially installed PiXel Detector (PXD1) was upgraded to a fully-populated two-layer PXD with 40 modules. These modules consist of a 250 × 768 pixel matrix, based on Depleted P-channel Field Effect Transistor (DePFET) technology and 3 types of row control and readout ASICs. As the PXD is positioned closest to the interaction region, it has to withstand the highest radiation levels.
Radiation damage leads to increasing levels of noise in the Drain Current Digitizer (DCD) ASIC. Since the exact nature and manifestation of this noise are not yet well understood, further investigation and the development of enhanced calibration routines are required.
In this talk, results from a dedicated X-ray irradiation campaign for the DCD will be presented, focusing on identifying and disentangling the noise effects from the rest of the system. Strategies for mitigating these issues will also be discussed.
Keywords: Belle II; PXD; Depfet; Drain Current Digitizer