Göttingen 2025 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 70: Silicon Detectors VI (MAPS, Mighty Tracker)

T 70.1: Vortrag

Donnerstag, 3. April 2025, 16:15–16:30, VG 0.111

Characterization of H2M: a MAPS produced in a 65 nm CMOS imaging process — •Sara Ruiz Daza^1,3, Rafael Ballabriga², Eric Buschmann², Michael Campbell², Raimon Casanova Moh², Dominik Dannheim², Ana Dorda², Finn King², Philipp Gadow², Ingrid-Maria Gregor^1,3, Karsten Hansen¹, Yajun He¹, Lennart Huth¹, Iraklis Kremastiotis², Corentin Lemoine², Stefano Maffessanti¹, Larissa Mendes^1,3, Younes Otarid¹, Christian Reckleben¹, Sebastien Rettie², Manuel Alejandro del Rio Viera^1,3, Judith Schlaadt¹, Adriana Simancas^1,3, Walter Snoeys², Simon Spannagel¹, Tomas Vanat¹, Anastasiia Velyka¹, Gianpiero Vignola^1,3, Håkan Wennlöf¹, and Ono Feyens¹ — ¹DESY, Hamburg, Germany — ²CERN, Geneva, Switzerland — ³University of Bonn, Bonn, Germany

The high energy physics community recently gained access to a 65 nm CMOS imaging process, which enables a higher density of in-pixel logic in MAPS. To explore this novel technology, the H2M (Hybrid-to-Monolithic) test chip has been designed and manufactured. The design followed a digital-on-top design workflow and ports a hybrid pixel-detector architecture into a monolithic chip.

This contribution will introduce the H2M chip and cover its characterization in the lab and test beam. A hit-detection efficiency above 99% has been measured, unaffected by thinning samples down to 21 um. Additionally, a measured non-uniformity of the in-pixel response related to the size and location of the n-wells in the analog circuitry will be discussed, as well as its impact on time resolution.

Keywords: H2M; Pixel; Monolithic; CMOS; Testbeam