Göttingen 2025 – wissenschaftliches Programm
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T: Fachverband Teilchenphysik
T 91: Silicon Detectors VIII (MAPS, misc.)
T 91.6: Vortrag
Freitag, 4. April 2025, 10:15–10:30, VG 1.101
Investigation of the Belle II Pixel Detector Power Supply Network — •Paula Scholz1, Florian Bernlochner1, Jochen Dingfelder1, Hans Krüger1, Jannes Schmitz1, and Botho Paschen2 — 1Physikalisches Institut, Universität Bonn, Nussallee 12, 53115 Bonn — 2Lawrence Berkeley National Laboratory
During beam loss events at the particle accelerator SuperKEKB in Japan, large amounts of radiation can severely damage the innermost layers of the Belle II detector, the Pixel Detector (PXD). Due to an increasing frequency of these events, the PXD has been shut down since May 2024 to prevent further harm.
The PXD consists of silicon pixel matrices based on the DEpleted P-channel Field Effect Transistor (DEPFET) technology. To control these matrices, Application-Specific Integrated Circuits (ASICs), the so-called switchers, are implemented on each module. During each readout cycle (50kHz), these switchers switch voltage levels of 20 V within a few nanoseconds. Since the PXD has been shown to be safe when the switchers are unpowered, a secure method to rapidly power down modules during beam loss events is needed. However, the powering network that involves 23 interdependent voltages, complicates this task.
To address this issue, a simulation of the PXD powering scheme, which includes more than 15 m long cables, has been developed. The transmission of emergency shutdown signals is studied by comparing simulation results with experimental data. The goal is to identify hardware modifications for safe PXD operation.