Regensburg 2025 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
CPP: Fachverband Chemische Physik und Polymerphysik
CPP 31: Responsive and Adaptive Polymers
CPP 31.3: Vortrag
Mittwoch, 19. März 2025, 17:00–17:15, H38
Critical analysis of adhesion work measurements from AFM-based techniques for soft contact — Dmitrii Sychev1, 2, Simon Schubotz1, 2, Quinn A. Besford1, Andreas Fery1, 3, and •Günter K. Auernhammer1 — 1Leibniz-Institut für Polymerforschung Dresden e.V., Dresden, Germany — 2TU Dresden, Germany — 3Chair of Physical Chemistry of Polymeric Materials,TU Dresden, Germany
The work of adhesion is a thermodynamic quantity that is frequently measured by atomic force microscopy (AFM). Its determination requires quasi-equilibrium measurements. Here, we address the question of to what extent atomic force microscopy qualifies for quasi-equilibrium measurements. To measure the work of adhesion, we combined soft colloidal probe AFM (SCP AFM) with reflection interference contrast microscopy (RICM). We extract the work of adhesion either from the pull-off force or from the contact radius to measure the adhesion behavior of poly(N-isopropylacrylamide) (PNIPAM) polymer brushes in the swollen and solvent-induced collapsed state. In the swollen state, the adhesion to the PNIPAM brush was fivefold larger and exhibited significant time dependencies when measured with SCP AFM. A strong rate dependence of the pull-off force method was indicative of a non-equilibrium process. In order to reliably determine the equilibrium work of adhesion, the contact radius method was found to be the better because it is not rate dependent. In summary, using optical measurements to determine the contact radius is beneficial when deriving the works of adhesion between colloidal probes and polymer brush surfaces.
Keywords: AFM; Reflection interference contrast microscopy; Adhesion; Polymer brushes