Regensburg 2025 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 13: Poster
DS 13.47: Poster
Donnerstag, 20. März 2025, 18:00–20:00, P1
The influence of stoichiometry on molybdenum oxide-based memristors — •Katerina Maskanaki1, Gion Kalemai2,3, Evangelos K. Evangelou1, and Anastasia Soultati2 — 1Department of Physics, University of Ioannina, 45110 Ioannina, Greece — 2Institute of Nanoscience and Nanotechnology (INN), National Center for Scientific Research Demokritos, 15341 Agia Paraskevi, Athens, Greece — 3Department of Physics, University of Patras, 26504 Patra, Rio, Greece
Transition metal oxides (TMOs) are a promising class of materials for neuromorphic computing and processing systems demonstrating a variety of resistive switching (RS) mechanisms. However, little is known about the correlation between its stoichiometry and RS. This study is focused on the development and characterization of molybdenum oxide memristors with different stoichiometry. Both, fully-stoichiometric (MoO3) and sub-stoichiometric (MoO3−x) molybdenum oxide devices showed good resistive switching behavior. However, the stoichiometric memristor exhibited better RS properties with endurance of 250 cycles, ON/OFF ratio > 102 and high retention of 2×104 s, compared to the poor RS behavior of the device based on the MoO3−x film. This impressive memristive behavior could be attributed to the excess of oxygen vacancies in the case of fully-stoichiometric memristor in respect to the sub-stoichiometric MoO3−x which play crucial role in the conductive behavior of the device. The high reproducibility observed in MoO3-based memristor highlights their potential for practical applications and scalability.
Keywords: memristors; transition metal oxides; resistive switching; stoichiometry; memristive behavior