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09:30 |
DS 9.1 |
Hauptvortrag:
Inverse Problems and Uncertainty Quantification for the analysis of thin films and nanostructured surfaces — •Sebastian Heidenreich, Nando Hegemann, Victor Soltwisch, and Markus Bär
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10:00 |
DS 9.2 |
Hauptvortrag:
Metrological spectroscopic and imaging Mueller matrix ellipsometry for the analysis of thin films and nanostructured surfaces — •Bernd Bodermann, Matthias Wurm, Manuela Schiek, Jana Grundmann, and Tim Käseberg
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10:30 |
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session break
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10:45 |
DS 9.3 |
Structured Light Microscopy for Optical and Topological Characterization — •Denis Ukolov, Polina Gromova, and Peter Lemmens
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11:00 |
DS 9.4 |
Synchrotron-based VUV ellipsometry on passivated Si samples for optical thin film metrology — •Julian Plaickner, Alexander Gottwald, Mattia Mulazzi, Jörg Rappich, Karsten Hinrichs, Christoph Cobet, Johanna Reck, and Norbert Esser
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11:15 |
DS 9.5 |
Tailoring Properties of Epitaxially Grown Bismuth Telluride Thin Films through Stoichiometric Control — •Felix Hoff, Christoph Ringkamp, Alexander Kiehn, Thomas Schmidt, Dasol Kim, Jonathan Frank, Timo Veslin, and Matthias Wuttig
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11:30 |
DS 9.6 |
VUV ellipsometry for the determination of thin film optical constants — •Mattia Mulazzi, Julian Plaickner, Jörg Rappich, Alexander Gottwald, and Norbert Esser
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11:45 |
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session break
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12:00 |
DS 9.7 |
Optical absorption by two-dimensional excitons (with and without screening) — •Stefan Zollner and Carlos Armenta
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12:15 |
DS 9.8 |
All-optical quality-control of indenene intercalation into graphene/SiC — •Cedric Schmitt, Simone Sotgiu, Stefan Enzner, Jonas Erhardt, Elena Stellino, Domenico Di Sante, Giorgio Sangiovanni, Ralph Claessen, Simon Moser, and Leonetta Baldassarre
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12:30 |
DS 9.9 |
Moiré lattice of twisted bilayer graphene as template for non-covalent functionalization — •Tobias Dierke, Stefan Wolff, Roland Gillen, Tamara Nagel, Jasmin Eisenkolb, Sabine Maier, Milan Kivala, Frank Hauke, Andreas Hirsch, and Janina Maultzsch
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