Regensburg 2025 – scientific programme

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HL: Fachverband Halbleiterphysik

HL 29: Poster II

HL 29.19: Poster

Tuesday, March 18, 2025, 18:00–20:00, P1

Polarisation dependant reflectance measurements of CrSBr — •Manuel Terbeck, Aleksandra Lopion, Pierre-Maurice Piel, and Ursula Wurstbauer — Institute of Physics, University of Muenster, Germany

The van der Waals layered material CrSBr has multiple interesting characteristics. It is an air-stable, optically active magnetic semiconductor. Magnetically, CrSBr exhibits ferromagnetic ordering in-plane and antiferromagnetic ordering between adjacent layers, with the easy axis being in-plane [1]. In this material the coupling between magnetic and optical properties is strong allowing us to study magnetic properties by measuring interband emissions and absorption spectra. The electronic structure is often described as quasi-1D due to the highly anisotropic properties [1]. Thus the polarisation of light is important when measuring CrSBr optically. With Raman scattering, we checked the symmetry of the crystal. Considering those axes, we measured reflectance from thin CrSBr flakes using different polarisation of light to get information about the excitonic states in this material. Unlike emission, reflectance measurements enables additional access to higher electronic states. [1] J. Klein, et al. ACS Nano, 17, 5316-5328 (2023)

Keywords: CrSBr; reflectance