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HL: Fachverband Halbleiterphysik
HL 29: Poster II
HL 29.89: Poster
Dienstag, 18. März 2025, 18:00–20:00, P1
Implementation and operation of a fiber-coupled CMOS detector for time-resolved photoemission electron microscopy — •Philipp Kessler1, Johanna Kinder1, Victor Lisinetskii1, Torsten Franz2, Florian Schütz2, Matthias Hensen1, and Tobias Brixner1 — 1Institut für Physikalische und Theoretische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg — 2ELMITEC Elektronenmikroskopie GmbH, 38678 Clausthal-Zellerfeld
Since their invention, low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) have predominantly relied on microchannel plates for electron detection and image generation. Recent developments in detector technology allow the LEEM-PEEM community to use pixel- [1] and fiber-based [2] detectors that have a small detection pixel size, avoid blooming effects, and have an extended dynamic range. These advancements are particularly beneficial for ultrafast time-resolved experiments with weak signals. Here, we present the integration of the fiber-coupled CMOS detector XF416 (TVIPS GmbH, Germany) into an Elmitec AC-LEEM III system. This includes a structural solution to address the detector’s inability to undergo bake-out, a critical step for achieving ultrahigh vacuum conditions. The first-time operation of the new detector unit is demonstrated through time- and energy-resolved PEEM measurements on terrylene bisimide-based molecular thin films, enabling the study of exciton dynamics at the nanoscale.
[1] G. Tinti et al., J. Synchrotron Rad. 24, 963 (2017).
[2] D. Janoschka et al., Ultramicroscopy 221, 113180 (2021).
Keywords: photoemission electron microscopy; ultrafast spectroscopy; time-resolved PEEM; electron detector; exciton dynamics