Regensburg 2025 – wissenschaftliches Programm
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HL: Fachverband Halbleiterphysik
HL 63: Focus Session: Nanoscale Light-matter Interaction II
HL 63.4: Vortrag
Freitag, 21. März 2025, 12:45–13:00, H14
Inelastic electron-light interaction probed by holographic scanning transmission electron microscopy — •Nora Bach1,2, Tim Dauwe1,2, Murat Sivis1,2, and Claus Ropers1,2 — 1Max Planck Institute for Multidisciplinary Sciences, Göttingen, Germany — 24th Physical Institute, University of Göttingen, Germany
Quantitative phase-contrast imaging of electrostatic potentials is an important application in transmission electron microscopy. Recently developed techniques have overcome the challenge to measure phase profiles inherited from optical fields, but offer only limited variability in tailoring the electron-light interactions and require a highly coherent electron source [1,2]. In this contribution, we introduce scanning transmission electron microscopy with spatially separated coherent electron probes [3] for the full imaging of complex optical near fields at a nanostructure with high spatial resolution. In the far field, these electron probes interfere to form a hologram from which we reconstruct phase shifts induced both by elastic scattering processes and by stimulated inelastic interactions. One particular advantage of STEM holography is the relaxed coherence requirements, which could be central to improving time-resolved imaging of electric and magnetic fields on the nanoscale.
[1] Gaida et al., Nat Commun. 14, (2023)
[2] Gaida et al., Nat. Photon. 18 (2024)
[3] Fehmi et al., J. Phys. D: Appl. Phys. 51 (2018)
Keywords: Ultrafast Tranmission Electron Microscopy; phase contrast; STEM; holography