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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 11: (Multi)ferroic States: From Fundamentals to Applications (V)

KFM 11.3: Vortrag

Mittwoch, 19. März 2025, 10:15–10:30, H9

Vector Scanning Electron Microscopy for Domain Imaging in Ferroelectric Polycrystals — •Ellinor Benedikte Anjali Lindström, Ruben Skjelstad Dragland, Jonas Åmli Ingdal, Jan Schultheiss, Jiali He, and Dennis Meier — NTNU Norwegian University of Science and Technology, Norway

Domain imaging in polycrystalline ferroelectrics is challenging due to the non-uniform crystallographic orientation of grains. To gain the full information including the domain polarization and orientational information, imaging techniques such as piezoresponse force microscopy (PFM) and scanning electron microscopy (SEM) are often complimented by electron backscatter diffraction (EBSD) experiments.

Here, we introduce a new SEM-based approach that allows simultaneous mapping of domains and grain orientation information. By performing systematic SEM measurements as a function of the stage rotation angle on the model system ErMnO₃, we observe distinct contrast intensity changes within the same grain. Notably, the domain contrasts invert when the stage is rotated by 180^∘. Complementary PFM and EBSD data confirm that these changes in contrast correlate with both the domain state and the orientation of the polar axis relative to the surface. Our approach offers a contact-free alternative to vector PFM and partially reduces the need for EBSD, giving new opportunities for domain imaging in ferroelectrics.

Keywords: Polycrystalline ferroelectrics; Vector SEM; Domain characterization