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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 16: Perovskite and Photovoltaics II (joint session HL/KFM)

KFM 16.11: Vortrag

Donnerstag, 20. März 2025, 12:15–12:30, H13

Phase evolution of sequential evaporated (FA/Cs)SnI₃ halide perovskite thin films via in situ X-ray diffraction — •Pu-Chou Lin¹, Josha Damm¹, Roland Scheer¹, and Paul Pistor² — ¹Institute of Physics, Photovoltaics Group, Martin-Luther-University, 06120 Halle, Germany — ²Departamento de Sistemas Físicas, Universidad Pablo de Olavide, 41013 Sevilla, Spain

Tin-based halide perovskites, particularly FASnI₃ and CsSnI₃, offer promising potential for photovoltaic applications. This study employs in situ X-ray diffraction to investigate these materials’ real-time growth mechanisms and thermal stability during sequential vapor deposition and annealing. Our results demonstrate that the deposition sequence significantly impacts the resulting perovskite film quality. For FASnI₃, the SnI₂-FAI stack yields superior, cavity-free films compared to the FAI-SnI₂ stack. This suggests that FAI is the primary diffusing species, with FASnI₃ forming at interfaces and completing its formation around 160^∘C. In contrast, the CsSnI₃ system exhibits more complex behavior. The SnI₂-CsI sequence leads to the formation of the intermediate phase Cs₂SnI₆, while the CsI-SnI₂ sequence directly forms CsSnI₃ with minimal defect formation. This suggests that SnI₂ is the dominant diffusing species in the Cs-based system. FASnI₃ and CsSnI₃ undergo thermal degradation at 200^∘C and 240^∘C, respectively, through co-desorption of their constituent elements. These findings provide valuable insights into tin-based perovskites’ growth mechanisms and thermal stability, which can guide future efforts to improve their performance and long-term stability.

Keywords: Halide perovskites; Physical vapor deposition; in situ X-ray diffraction; Formamidinium tin iodide; Cesium tin iodide