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MA: Fachverband Magnetismus

MA 39: Magnetic Thin Films

MA 39.5: Vortrag

Donnerstag, 20. März 2025, 16:15–16:30, H19

Layer-resolved Vector Magnetometry using Generalized Magneto-optical Ellipsometry — •Carmen Martín Valderrama, Irene Prieto, Mikel Quintana, and Andreas Berger — CIC nanoGUNE BRTA, E-20018 Donostia-San Sebastián, Spain

For a detailed and quantitatively precise understanding of magnetic multilayers it is crucially important to determine their spatial magnetization configurations, particularly along the depth of their structures. Here, we demonstrate that it is possible to achieve layer-resolved vector magnetometry in nanoscale magnetic multilayer films by means of a single magneto-optical reflection experiment. We designed, fabricated, and measured a set of epitaxial ferromagnetic/non-magnetic/ferromagnetic multilayer samples that exhibit in-plane uniaxial anisotropy and a tunable ferromagnetic interlayer coupling strength through the non-magnetic interlayer. By means of Generalized Magneto-optical Ellipsometry measurements, we obtain the entire optical reflection matrix R of a given sample for each applied field value, which allows us to monitor the field evolution of the magnetization vector for the two ferromagnetic layers independently. Hereby, we observe that the magnetization switching of one layer can trigger a discontinuous change of the magnetization in the second layer even for weak ferromagnetic interlayer coupling. Moreover, we reproduce the obtained behavior using a model of two coupled macrospins, which corroborates even the unexpected aspects of our experimental results and thus reinforces the sensitivity and reliability of our experimental layer-resolved vector magnetometry.

Keywords: Vector magnetometry; Magneto-optics; Multilayers