Regensburg 2025 – scientific programme
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O: Fachverband Oberflächenphysik
O 101: Topology and Symmetry-protected Materials (joint session O/TT)
O 101.7: Talk
Friday, March 21, 2025, 12:00–12:15, H25
Simultaneous Atomic-Scale Imaging and Electronic Characterization of Wet-Chemically Prepared Bi2Se3 Nanoplatelets — •Auke Vlasblom, Victor Wesselingh, Jara Vliem, Daniel Vanmaekelbergh, and Ingmar Swart — Utrecht University, Utrecht, The Netherlands
Colloidal semiconductor nanoparticles are of great interest for various optoelectronic applications, such as integration in displays, solar cells and electronics. For applications, the surface of nanoparticles is of critical importance. However, until now, no technique exists to simultaneously investigate the atomic structure (e.g. the presence of defects) and the electronic properties of a nanoparticle, foremost limited by the presence of ligands that prevent direct access to the surface with a local probe. Here, we present a new and widely applicable procedure that allows investigation of the surface of a nanoparticle with a local probe. Using this method, nanoparticles are transferred to an atomically clean substrate under ultra-high vacuum conditions. We demonstrate the procedure for topological two-dimensional Bi2Se3 nanoplatelets deposited on Au(111). We reveal the atomic and electronic structure of the surface of colloidally synthesised Bi2Se3 nanoplatelets with scanning tunneling microscopy and spectroscopy measurements. In this talk, I will highlight the various types of defects that occur at the (sub-)surface of Bi2Se3 nanoplatelets and I will show their influence on the electronic structure.
Keywords: Scanning tunneling microscopy; Topological insulator; Bismuth selenide; Nanocrystal