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O: Fachverband Oberflächenphysik
O 23: Poster Ultrafast Electron Dynamics
O 23.10: Poster
Montag, 17. März 2025, 18:00–20:00, P2
Terahertz Excitation Source for Next Generation Time-of-Flight Momentum Microscopy at FLASH — Michael Herb1, •Stefan Miedaner1, Thomas Seitz1, Jure Demsar2, Stephan Winnerl3, and Isabella Gierz1 — 1University of Regensburg, Germany — 2Johannes Gutenberg University of Mainz, Germany — 3Helmholtz Center Dresden-Rossendorf, Germany
We will combine the broad spectral tunability of the free-electron laser FLASH with Terahertz excitation for next-generation time-of-flight momentum microscopy (ToF-MM). This unique combination will enable unprecedented access to the non-equilibrium electronic and structural properties of novel quantum materials using a variety of time-resolved spectroscopic, diffraction, and microscopic techniques. This requires the design and installation of a compact Terahertz pump source operating at Megahertz repetition rate. Here, we present the current status of the photoconductive-emitter-based source [1] and its characterization by electro-optic sampling.
[1] Optics Express 29, 427247 (2021)
Keywords: THz generation; momentum microscopy; FLASH