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O: Fachverband Oberflächenphysik

O 24: Poster Scanning Probe Techniques: Method Development

O 24.1: Poster

Montag, 17. März 2025, 18:00–20:00, P2

Comparative Analysis of Work Function Measurements Using STM/AFM Techniques — •Daryoush Nosraty Alamdary, Matthias Bode, and Artem Odobesko — Physikalisches Institut, Experimentelle Physik II, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany

The engineering of the work functions at the interface of complex materials is sometimes the key [1] for an energy band tuning that supports proximity-induced effects [2]. While there are handful of established methods that allow a precise measurement and determination of the work function, STM-based methods constitute a class of their own since they are based on a local probe. In this work we present a comparative study of 3 different techniques based on a combined STM/AFM setup. For a few well-characterized sample systems we analyze the benefits and difficulties of each method. Finally, we draw a conclusion as to which method is the more precise and reliable method, whereby the special focus lies on the accuracy and the challenges of the interpretation.
[1] P. Rüßmann em et al., Proximity induced superconductivity in a topological insulator, arXiv:2208.14289 (2022)
[2] L. Fu and C. L. Kane, Superconducting Proximity Effect and Majorana Fermions at the Surface of a Topological Insulator, Phys. Rev. Lett. 100, 096407 (2008)

Keywords: Field Emission Resonances; Work Function; STM; QPlus; Kelvin-Probe Force Spectroscopy