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O: Fachverband Oberflächenphysik

O 24: Poster Scanning Probe Techniques: Method Development

O 24.8: Poster

Montag, 17. März 2025, 18:00–20:00, P2

A Closed-Cycle Atomic Force Microscopy Setup for Electron Spin Resonance Measurements at mK Temperatures — •Adrian Seiler, Lovis Hardeweg, Luise Renz, Arian Vosoghi Marand, Kwan Ho Au-Yeung, Wantong Huang, Paul Greule, Máté Stark, Christoph Sürgers, Wolfgang Wernsdorfer, Johannes Schwenk, and Philip Willke — Physikalisches Institut (PHI), Karlsruhe Institute of Technology, Karlsruhe, Germany

Combining scanning probe techniques with electron spin resonance (ESR) provides a unique tool for the investigation as well as the manipulation of individual surface-adsorbed spins. Most experiments up to date are relying on Scanning Tunneling microscopy (STM) and thus conductive samples [1]. As a result, scattering of electrons with the spin system is a major source of decoherence and relaxation. In contrast, atomic force microscopy (AFM) provides the possibility to reduce the scattering intensity with the conducting electrodes. Here, we present the first implementation steps of a commercial AFM head and ultra-high vacuum setup in a compact dilution refrigerator. The final setup is designed to reach milli-Kelvin temperatures (≈50 mK) with short cool-down times on the order of several hours. In addition to the dilution unit, the system utilizes a closed-cycle cryocooler allowing longtime stable operation. We further improve the time-consuming sample preparation by automation of the sputter and annealing process to allow for a rapid turnaround of samples in the future.

[1] Y. Chen et al. Adv. Mater. 35, 2107534 (2023).

Keywords: atomic force microscopy; closed-cycle dilution refrigerator