Regensburg 2025 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 26: Focus Session Ultrafast Electron Microscopy at the Space-Time Limit III
O 26.7: Vortrag
Dienstag, 18. März 2025, 12:15–12:30, H2
Developing a versatile fiber-based cathodoluminescence detection system for an ultrafast scanning electron microscope — •Paul H. Bittorf1, Filip Majstorovic1, and Nahid Talebi1,2 — 1Institute for Experimental and Applied Physics IEAP, Kiel University, 24118 Kiel, Germany — 2Kiel Nano, Surface and Interface Science KiNSIS, Kiel University, 24118 Kiel, Germany
Cathodoluminescence (CL) is emitted when a high-energy electron beam interacts with materials like minerals, semiconductors and plasmonic nanoparticles. Depending on the underlying interaction mechanisms of electrons with the sample this radiation can be coherent or incoherent, where both spectral and temporal statistics can be unraveled for material characterization. Thanks to the high spatial resolution and large spectral excitation bandwidth of the electron beams, we could resolve the spatial far-field distribution of locally probed photonic modes by CL microscopy. Moreover, we combined a commercial scanning electron microscope (SEM) with an ultrafast laser system to obtain a pulsed electron beam via the photoemission process. In addition to the excitation by the pulsed electron beam, a time-delayed laser pulse is focused onto the sample to induce an optical near-field and achieve a time-resolved pump-probe measurement. The interaction properties of electrons with nanostructured matter are analyzed through the emitted CL. Here, we report on technical aspects and the implementation of a multimode fiber-based CL detection system inside an ultrafast SEM and highlight its functionality by performing CL spectroscopy and time correlated single-photon counting.
Keywords: Cathodoluminescence; Electron Microscope; Spectroscopy; Electron-Matter-Interaction; Fiber