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O: Fachverband Oberflächenphysik

O 33: Poster Graphene: Electronic Structure and Excitations

O 33.9: Poster

Dienstag, 18. März 2025, 13:30–15:30, P3

Scanning tunneling potentiometry methods for intercalated graphene systems — •Tim Güldenpfennig¹, Simeon Bode², Markus Gruschwitz¹, Martin Wenderoth², and Christoph Tegenkamp¹ — ¹Institut für Physik, TU Chemnitz, Germany — ²IV. Physikalisches Institut, Universität Göttingen, Germany

Graphene and graphene-based (hetero-)systems were subjects in a wide range of studies in the past decades revealing their intriguing electronic properties. Epitaxially grown graphene on SiC plays a vital role as a base for electronic application. By intercalating such grown buffer layer with different elements the electronic properties of the decoupled graphene layer can be precisely manipulated. Recently a great interest in the two dimensional intercalant layers arose as well. The latest advance towards intercalation of heavy elements (Pb, Bi, etc.) comes along with new challenges due to defect-dependent intercalation paths. Macro- and mesoscopic transport experiments on these percolated but multi-scale defective intercalated phases become impractical [1].

For transport investigations at the nanometer scale we utilize scanning tunneling potentiometry (STP). In combination with finite element simulations the conductivity of the intercalated phase and the influence of defects can be separated precisely. Two different setups to investigate the transport properties of intercalated graphene systems on nanoscopic scale are presented. One is implemented in a 4pp-STM/SEM setup with the ability to locally apply transverse voltages. The other setup uses an home-built STM for measurements at 6 K with micro-Volt resolution. [1] Phys. Rev. B 109, 245430 (2024)

Keywords: scanning tunneling microscopy; scanning tunneling potentiometry; intercalated graphene