Regensburg 2025 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

O: Fachverband Oberflächenphysik

O 50: Poster Organic Molecules on Inorganic Substrates: Adsorption and Growth

O 50.3: Poster

Dienstag, 18. März 2025, 18:00–20:00, P2

Determining the Epitaxial Relations of Lead Phthalocyanine on Graphitic Surfaces — •Marco Gruenewald, Roman Forker, Matthias Spoddeck, and Torsten Fritz — Friedrich-Schiller-Universität Jena, Institut für Festkörperphysik, Helmholtzweg 5, 07743 Jena, Germany

The epitaxial relations between lead phthalocyanine (PbPc) layers and single-crystal graphite (SCG) as well as few-layer graphene/SiC(0001) are determined. Compared to previous reports, we obtain a clearly improved precision by combining the following concepts: [i] the use of distortion-corrected, calibrated low-energy electron diffraction (LEED), [ii] the complementary use of large-scale scanning tunneling microscopy (STM) with high resolution, [iii] the evaluation of multiple scattering features in LEED and Moiré spots in Fourier-transformed STM images, [iv] the simulation of those reciprocal-space patterns with an objective numerical fitting to the experimentally discernible spots, and [v] the analysis of the STM Moiré patterns in real space. Our independently determined LEED and STM results mutually confirm each other due to the remarkably similar structural parameters obtained. For all systems investigated we find noncommensurate, point-on-line coincident registries, and the epitaxial relations of PbPc layers on SCG and on graphene/SiC(0001) are found to be nearly identical despite the different compositions of those substrates. https://doi.org/10.1021/acs.cgd.4c01055

Keywords: organic molecular beam epitaxy (OMBE); low-energy electron diffraction (LEED); scanning tunneling microscopy (STM); Moiré pattern analysis