O 52: New Methods: Experiment
Dienstag, 18. März 2025, 18:00–20:00, P2
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18:00 |
O 52.1 |
Exploring novel scanning force microscopy schemes by stabilising unstable states — •Lukas Böttcher, Hannes Wallner, Niklas Kruse, Wolfram Just, Ingo Barke, Jens Starke, and Sylvia Speller
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18:00 |
O 52.2 |
Surface photovoltage spectroscopy for investigation of SiC surface quality — •Viktoriia Nikonova, Nadine Schüler, Steffen Fengler, Maaz Soomro, Knut Gottfried, Imme Ellebrecht, and Kay Dornich
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18:00 |
O 52.3 |
ESEM Automation - Advanced Acquisition & Dual Magnification — •Maurits Vuijk, Annika Kubsch, Johannes Zeininger, Karsten Reuter, Thomas Lunkenbein, and Christoph Scheurer
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18:00 |
O 52.4 |
Simultaneous Grazing Incidence Small Angle X-Ray Scattering (GISAXS) and Absorption Spectroscopy (XAS) of Liquid Surfaces — •Carlo Schneider, Lukas Voss, Frederic Braun, and Dirk Lützenkirchen-Hecht
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18:00 |
O 52.5 |
Surface-Sensitive Analysis of Liquid Interfaces: Grazing Incidence X-Ray Absorption Spectroscopy with a Double-Mirror Setup — •Lukas Voß, Dirk Lützenkirchen-Hecht, Frederic Braun, and Carlo Schneider
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