Regensburg 2025 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 52: New Methods: Experiment
O 52.1: Poster
Dienstag, 18. März 2025, 18:00–20:00, P2
Exploring novel scanning force microscopy schemes by stabilising unstable states — •Lukas Böttcher1, Hannes Wallner2, Niklas Kruse2, Wolfram Just2, Ingo Barke1, Jens Starke2, and Sylvia Speller1 — 1Universität Rostock, Institute of Physics — 2Universität Rostock, Institute of Mathematics
Dynamic scanning Force Microscopy (SFM) is a versatile and popular method for investigation of surface properties on the nanoscale. When probing the surface with an oscillating cantilever bistabilities may occur [1, 2], which are a result of nonlinearities arising due to interaction between tip and sample. By implementing a control scheme, we track the unstable state arising between the two stable states [3]. These unstable states may enable ultra-sensitive imaging conditions and give access to virtually interaction free mapping of material parameters.
[1] Gleyzes, P., Kuo, P.K., Boccara, A.: Bistable behavior of a vibrating tip near a solid surface. Appl. Phys. Lett. 58, 2989 (1991) [2] Misra, S., Dankowicz, H., Paul, M.: Event-driven feedback tracking and control483 of tapping-mode atomic force microscopy. Royal Society of London Proceedings484 Series A 464, 2113*2133 (2008) [3] Böttcher et.al, Exposing hidden orbits in scanning force microscopy, in preparation
Keywords: AFM; control scheme; chaos; nonlinear