Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
O: Fachverband Oberflächenphysik
O 60: Plasmonics and Nanooptics: Fabrication, Characterization and Applications I
O 60.7: Vortrag
Mittwoch, 19. März 2025, 12:00–12:15, H8
Analytical study of Mie void resonances — Timothy J. Davis1,2, •Julian Schwab1, Harald Giessen1, and Mario Hentschel1 — 14th Physics Institute, Research Center SCoPE, and Integrated Quantum Science and Technology Center, University of Stuttgart, Germany — 2School of Physics, University of Melbourne; Parkville Victoria 3010, Australia
The preferential light scattering at particular wavelengths by mall particles is a well know phenomenon since the introduction of an analytical theory by Gustav Mie in 1908. Over the decades, this theory has helped in understanding, designing, and optimizing a multitude of plasmonic and dielectric nanophotonic systems. Just recently it was shown that Mie scattering can also be observed from voids in high-index dielectric media, such as silicon or gallium arsenide. This phenomenon is particularly counterintuitive as the void sizes are on the order of the resonant wavelength, rendering full-wave simulations and thus a deeper understanding challenging. Here, we present a new analytical model to study and understand the resonance properties of Mie voids. In particular, we derive analytical expressions of the electric field distribution based on solutions of Maxwell's equations for cylindrical holes in the substrate. These solutions are used in a simple three-layer model of the void that gives predictions of the void resonances, the observed spectra, as well as the microscopic appearance. Our model will aid in the future design of Mie-void based systems and applications, such as nanophotonic sensors, metasurfaces, and nanoscale detection.
Keywords: Mie voids