Regensburg 2025 – scientific programme
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O: Fachverband Oberflächenphysik
O 80: Organic Molecules on Inorganic Substrates: Electronic, Optical and Other Properties I
O 80.4: Talk
Thursday, March 20, 2025, 11:15–11:30, H4
Photo-induced force microscopy of organic molecules on thin van der Waals substrates — •Markus Kratzer1, Mohamad Khan1, Simon Leitner1, Aleksandar Matkovic1, Olivier Siri2, Conrad Becker2, and Christian Teichert1 — 1Chair of Physics, Montanuniversität Leoben, Franz-Josef Straße 18, 8700 Leoben, AUT — 2Aix Marseille Univ., CNRS, Cinam, 13288 Marseille, FGrance
Photo-induced force microscopy (PiFM) is an atomic force microscopy based technique for obtainiung infrared spectroscopic data with a spatial resolution down to a few 10 nm. Here, we utilized PiFM to investigate nano and microstructures comprising small organic molecules like para-hexaphenyl or dihydro-tetraaza-acene (DHTA7) on exfoliated thin layers of van der Waals materials as hexagonal boron nitride (hBN). It is notices that the PiFM spectra systematically vary with van der Waals substrate thickness. Further PiFM spectra of upright standing molecular structures and flat lying structures are copared. PiFM turned out to be sensitive even for single molecular layers, which are only about 2 nm thick. Similarities and differences between thin film and bulk infrared data are discussed.
Keywords: Phot-induced force microscopy; organic structures; van der Waals substrates