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Münster 1997 – wissenschaftliches Programm

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DS: Dünne Schichten

DS 33: Postersitzung

DS 33.15: Poster

Dienstag, 18. März 1997, 16:15–17:45, Aula

Ferromagnetic Resonance on Electrodeposited Ni-Films — •J. Pflaum1, E. Huebner1, J. Pelzl1, J.L. Bubendorff2, J.P. Bucher2, and Z. Frait31Inst. fuer Experimentalphysik III, Ruhr-Universitaet, 44780 Bochum, Germany — 2IPCMS, 67037 Strasbourg, France — 3Inst. of Physics, Academy of Sciences, 18040 Prague 8, Czech Republic

Ferromagnetic Resonance (FMR) Spectroscopy at microwave-frequencies of 9GHz to 70GHz was used to study the magnetic properties of thin electrodeposited Ni films. The polycrystalline samples at thicknesses of 10Å to 4000Å were prepared by Watts-bath technique on glass and on mica substrates with an (111)-textured gold buffer [1]. To estimate the influence of the microscopic structure on the magnetic parameters Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) studies were performed. From FMR at different in-plane and out-of-plane orientations of the samples in the external field we obtain the magnetization, the g-factor, and the uniaxial anisotropy contribution. Variation of the film thickness yields an effective surface anisotropy, KS, with a preferred alignment of the magnetization in the film plane. In comparison to single crystalline Ni samples KS is considerably increased. In addition, the sensitivity of the FMR linewidth on structural imperfections enabled us to qualify the coherence of the film growth.
Supported by DFG (SFB166) and by VW-foundation.

[1] J.L. Bubendorff et al., J. Magn. Magn. Mat. (1996) to be published

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