Berlin 2005 – scientific programme
Parts | Days | Selection | Search | Downloads | Help
O: Oberflächenphysik
O 15: Postersitzung (Adsorption an Oberfl
ächen, Epitaxie und Wachstum, Organische Dünnschichten, Oxide und Isolatoren, Rastersondentechniken, Zeitaufgelöste Spektroskopie, Methoden)
O 15.80: Poster
Friday, March 4, 2005, 17:00–20:00, Poster TU D
Contrast mechanisms in imaging spectroscopy using the nanoESCA — •S. Schmidt1, F. Forster2, F. Reinert2, M. Escher3, N. Weber3, M. Merkel3, D. Funnemann4, B. Krömker4, Ch. Ziethen5, P. Bernhard5, H.-J. Elmers5, G. Schönhense5, and S. Hüfner1 — 1Universität des Saarlandes, D-66041 Saarbrücken — 2Universität Würzburg, D-97074 Würzburg — 3Focus GmbH, D-65510 Hünstetten — 4OmicronNanoTechnology GmbH, D-65232 Taunusstein — 5Universität Mainz, D-55128 Mainz
We present the results obtained during
synchrotron measurements using the nanoESCA prototype for
imaging XPS to demonstrate its imaging capabilities of elemental,
chemical, magnetic and orientational contrast in prototypical
samples with a spatial resolution better than 120 nm, an energy
resolution of Δ E ≤ 110 meV and the ability to image
electrons with kinetic energies up to 1.6 keV [1]. We
demonstrate the extension of the standard applications of imaging
ESCA systems to the use of MCD and MLDAD contrast in the Fe 2p XPS
core-level spectra to map ferromagnetic domains. We also show how
the nanoESCA setup can be used to distinguish between
different grain orientations in poly-crystalline materials by
measuring the electronic structure
of single grains [2].
[ 1 ] M. Escher et al., J. Phys.: Condens.
Matter, in print.
[ 2 ] M. Escher et. al, J. Electron Spectrosc.
Relat. Phenom., in print