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O: Oberflächenphysik

O 15: Postersitzung (Adsorption an Oberfl
ächen, Epitaxie und Wachstum, Organische Dünnschichten, Oxide und Isolatoren, Rastersondentechniken, Zeitaufgelöste Spektroskopie, Methoden)

O 15.80: Poster

Freitag, 4. März 2005, 17:00–20:00, Poster TU D

Contrast mechanisms in imaging spectroscopy using the nanoESCA — •S. Schmidt¹, F. Forster², F. Reinert², M. Escher³, N. Weber³, M. Merkel³, D. Funnemann⁴, B. Krömker⁴, Ch. Ziethen⁵, P. Bernhard⁵, H.-J. Elmers⁵, G. Schönhense⁵, and S. Hüfner¹ — ¹Universität des Saarlandes, D-66041 Saarbrücken — ²Universität Würzburg, D-97074 Würzburg — ³Focus GmbH, D-65510 Hünstetten — ⁴OmicronNanoTechnology GmbH, D-65232 Taunusstein — ⁵Universität Mainz, D-55128 Mainz

We present the results obtained during synchrotron measurements using the nanoESCA prototype for imaging XPS to demonstrate its imaging capabilities of elemental, chemical, magnetic and orientational contrast in prototypical samples with a spatial resolution better than 120 nm, an energy resolution of Δ E ≤ 110 meV and the ability to image electrons with kinetic energies up to 1.6 keV [1]. We demonstrate the extension of the standard applications of imaging ESCA systems to the use of MCD and MLDAD contrast in the Fe 2p XPS core-level spectra to map ferromagnetic domains. We also show how the nanoESCA setup can be used to distinguish between different grain orientations in poly-crystalline materials by measuring the electronic structure of single grains [2].
[ 1 ] M. Escher et al., J. Phys.: Condens. Matter, in print.
[ 2 ] M. Escher et. al, J. Electron Spectrosc. Relat. Phenom., in print