Dresden 2006 – wissenschaftliches Programm

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MA: Magnetismus

MA 20: Poster: Films(1-36) Transp(37-56) Ex.Bias(57-67) Spindyn(68-80) Micromag(81-95) Particle(96-109) Imag.+Surface(110-113) Spinelectr(114-122) Theory+Micromag(123-131) Spinstr+Aniso(132-142) MagMat(143-156) Meas(157,158) MolMag+Kondo(159-162) Postdead(163-)

MA 20.4: Poster

Dienstag, 28. März 2006, 15:15–19:15, P1

Resonant magnetic soft x-ray scattering from thin EuTe layers — •Enrico Schierle¹, Eugen Weschke¹, Alexander Gottberg¹, Günter Kaindl¹, Walter Söllinger², and Gunther Springholz² — ¹Institut für Experimentalphysik, Freie Universität Berlin, D-14195 Berlin, Germany — ²Institut für Halbleiterphysik, Johannes Kepler University, A-4040 Linz, Austria

Magnetic structures and short-range correlations in thin EuTe(111) films [1] were studied by magnetic soft x-ray scattering at the Eu M₅ resonance. The prototypical Heisenberg antiferromagnet EuTe is ideally suited for a magnetic scattering study: (i) The high magnetic sensitivity at the lanthanide M₅ resonance [2] can be exploited and (ii) for the x-ray wavelength of the resonance, the magnetic signal appears exactly at the Brewster angle, which results in magnetic scattering virtually free of charge-scattering background. Magnetic diffraction provides well-resolved Laue profiles that permit a detailed reconstruction of the real-space magnetization profiles across the films, i.e. the temperature-dependent magnetization of the individual layers. The reduced values of the magnetization in the outer layers and the different temperature dependences compared to the inner layers are in good agreement with theoretical considerations. The high sensitivity of the method further permits even critical scattering studies above the ordering temperature in films with thicknesses down to 2 EuTe layers, revealing a transition to two-dimensional magnetic behavior around 3 EuTe layers.

[1] H. Kepa et al., Phys. Rev. B 68, 24419 (2003).

[2] E. Weschke et al., Phys. Rev. Lett. 93 (157204), 2004.