Dresden 2006 – scientific programme
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O: Oberflächenphysik
O 35: Organic films III
O 35.2: Talk
Thursday, March 30, 2006, 11:30–11:45, WIL B321
Morphology of Sexiphenyl thin films — •Gregor Hlawacek1, Andrei Andreev1, Christian Teichert1, Paul Frank2, Adolf Winkler2, Roland Resel2, and Michael Ramsey3 — 1Institut of Physics, University of Leoben, 8700 Leoben, Austria — 2Department of Solid State Physics, Graz Technical University, A-8010 Graz, Austria — 3Department of Experimental Physics, University of Graz, A-8010 Graz, Austria
Understanding and controlling the growth of organic thin films is vital for the production of high quality organic devices. Small organic molecules have shown a high potential for applications like organic lasers, organic light emitting devices and organic thin film transistors.
Here, para-sexiphenyl has been grown under UHV conditions at different growth temperatures. The used substrates include Si(001), mica(001), BaF2(111) and KCl(001). Ex-situ as well as in-situ atomic-force microscopy (AFM) has been used to characterize the film morphology. Phase imaging has shown to be a usefull tool to analyse the growth of the first few monolayers. In addition, some of the films have been analysed by different X-ray methodes.
The molecular orientation (upright or parallel to the substrate) can be controlled by using the right combination of substrate and growth temperature. The films formed from lying molecules usually show a higher anisotropy that is mediated by the underlying substrate.