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O: Oberflächenphysik

O 35: Organic films III

O 35.2: Vortrag

Donnerstag, 30. März 2006, 11:30–11:45, WIL B321

Morphology of Sexiphenyl thin films — •Gregor Hlawacek¹, Andrei Andreev¹, Christian Teichert¹, Paul Frank², Adolf Winkler², Roland Resel², and Michael Ramsey³ — ¹Institut of Physics, University of Leoben, 8700 Leoben, Austria — ²Department of Solid State Physics, Graz Technical University, A-8010 Graz, Austria — ³Department of Experimental Physics, University of Graz, A-8010 Graz, Austria

Understanding and controlling the growth of organic thin films is vital for the production of high quality organic devices. Small organic molecules have shown a high potential for applications like organic lasers, organic light emitting devices and organic thin film transistors.

Here, para-sexiphenyl has been grown under UHV conditions at different growth temperatures. The used substrates include Si(001), mica(001), BaF₂(111) and KCl(001). Ex-situ as well as in-situ atomic-force microscopy (AFM) has been used to characterize the film morphology. Phase imaging has shown to be a usefull tool to analyse the growth of the first few monolayers. In addition, some of the films have been analysed by different X-ray methodes.

The molecular orientation (upright or parallel to the substrate) can be controlled by using the right combination of substrate and growth temperature. The films formed from lying molecules usually show a higher anisotropy that is mediated by the underlying substrate.