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TT: Tiefe Temperaturen
TT 7: Superconductivity & Solids At Low Temperature - Poster Session
TT 7.10: Poster
Monday, March 27, 2006, 14:00–17:45, P1
TEM cross-section analysis of La2Zr2O7 buffer layers for YBCO-coated conductors prepared by chemical solution deposition — •Leopoldo Molina1, Sebastian Engel2, Kerstin Knoth2, Bernhard Holzapfel2, and Oliver Eibl1 — 1Institute of Applied Physics, University of Tuebingen, Auf der Morgenstelle 10, D-72076 Tuebingen, Germany — 2IFW Dresden, Leibniz Institute for Solid State and Materials Research Dresden, Helmholtzstr. 20, D-01069 Dresden, Germany
Chemical solution deposition is a promising method to fabricate low cost buffer layers for YBCO-coated conductors. In this study we present transmission electron microscopy (TEM) analysis of cross-sectional and plan-view prepared La2Zr2O7 buffer layers on biaxially textured Ni-W substrates for YBCO-coated conductors prepared by chemical solution deposition methods. The La2Zr2O7 buffer layers were deposited on 100 µm thick Ni-W substrate and were heat treated at 900∘C and 1050∘C. TEM cross-section samples were prepared by conventional mechanical polishing and ion milling techniques. By means of transmission electron microscopy the grain size, the buffer layer thickness, the void size and void density and the orientation of LZO with respect to the Ni substrate was determined. The Ni-W substrate interface with the La2Zr2O7 buffer layer was also investigated. Using two-beam imaging conditions bright-field, dark-field and energy spectroscopic images (ESI) were acquired. Chemical composition determination of the films and substrate was done by energy dispersive X-ray microanalysis (EDX).