Regensburg 2007 – scientific programme

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DS: Fachverband Dünne Schichten

DS 14: Thin Film Analytics III

DS 14.5: Talk

Tuesday, March 27, 2007, 17:45–18:00, H34

Characterization of GdScO₃ layers by Spectroscopic Ellipsometry — Martin Roeckerath, •Jürgen Moers, Jürgen Schubert, and Siegfried Mantl — Institut of Bio- und Nanosystems, Forschungszentrum Jülich, D-52425 Jülich

This contribution has been appended to session DS 26.