Berlin 2008 – scientific programme
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O: Fachverband Oberflächenphysik
O 90: Methods: Scanning Probe Techniques II
O 90.4: Talk
Friday, February 29, 2008, 11:00–11:15, MA 042
Spectroscopic THz near-field microscope — •Hans-Georg von Ribbeck4,1, Markus Brehm1, Daniel van der Weide2, Manfred Helm3, Oleksy Drachenko3, Stephan Winnerl3, and Fritz Keilmann1 — 1Max-Planck-Institut für Biochemie and Center of Nanoscience, 82152 Martinsried*Max-Planck-Institut für Biochemie and Center of Nanoscience, Martinsried, Germany — 2Dept. of Electrical and Computer Engineering, University of Wisconsin, Madison, WI 53706-1691, USA — 3Forschungszentrum Dresden-Rossendorf, 01314 Dresden, Germany — 4Institut für Angewandte Photophysik, TU Dresden, Germany
We demonstrate operating a scanning near-field opticalmicroscope of scattering type (s-SNOM) with broadband THz illumination. A home-made cantilevered W tip is used in a tapping-mode AFM. The direct scattering spectrum is obtained and optimized by asynchronous optical sampling (ASOPS), while near-field scattering is observed by using a space-domain delay stage and harmonic demodulation of the detector signal. True near-field interaction is manifested from the distance-dependence of gold samples. Furthermore scattering spectra of differently doped silicon are presented.