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O: Fachverband Oberflächenphysik

O 90: Methods: Scanning Probe Techniques II

O 90.4: Vortrag

Freitag, 29. Februar 2008, 11:00–11:15, MA 042

Spectroscopic THz near-field microscope — •Hans-Georg von Ribbeck^4,1, Markus Brehm¹, Daniel van der Weide², Manfred Helm³, Oleksy Drachenko³, Stephan Winnerl³, and Fritz Keilmann¹ — ¹Max-Planck-Institut für Biochemie and Center of Nanoscience, 82152 Martinsried*Max-Planck-Institut für Biochemie and Center of Nanoscience, Martinsried, Germany — ²Dept. of Electrical and Computer Engineering, University of Wisconsin, Madison, WI 53706-1691, USA — ³Forschungszentrum Dresden-Rossendorf, 01314 Dresden, Germany — ⁴Institut für Angewandte Photophysik, TU Dresden, Germany

We demonstrate operating a scanning near-field opticalmicroscope of scattering type (s-SNOM) with broadband THz illumination. A home-made cantilevered W tip is used in a tapping-mode AFM. The direct scattering spectrum is obtained and optimized by asynchronous optical sampling (ASOPS), while near-field scattering is observed by using a space-domain delay stage and harmonic demodulation of the detector signal. True near-field interaction is manifested from the distance-dependence of gold samples. Furthermore scattering spectra of differently doped silicon are presented.