Berlin 2012 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 91: [MA] Poster II
O 91.21: Poster
Freitag, 30. März 2012, 11:00–14:00, Poster A
Temperature and thickness dependent sign change of the Anomalous Hall Effect in Co/Pd multilayers — •Vedat Keskin1,2, Bekir Aktas2, Zoe Kugler1, Jan-Michael Schmalhorst1, and Günter Reiss1 — 1Thin Films & Physics of Nanostructures, Bielefeld University, Germany — 2Gebze Institute of Technology, Izmit, Turkey
The anomalous Hall effect (AHE) [1] was studied on ultra-thin Co/Pd multilayers, which might be a promising material for AHE based perpendicular magnetic recording technology [2]. The Co/Pd multilayers were grown on Si wafers by using conventional dc magnetron sputtering techniques. We focused on the Co thickness and temperature dependence of the AHE and the longitudinal resistivity, whereas the Pd thickness was kept constant at 1.8nm. The Co thickness was incrementally increased from 0.20nm to 0.55 nm. The AHE measurements were carried out in the temperature range of 14-330 K.Uniquely, we have observed that for a fixed temperature the polarity of the AHE changes at a certain Co thickness, the critical Co thickness decreases with increasing temperature. This behavior will be discussed with respect to the influence of extrinsic skew scattering [3]. [1] E. H. Hall, Philos. Mag. 10, 301 (1880) [2] D. Rosenblatt, M. Karpovski, and A. Gerber, Appl. Phys. Lett. 96, 022512 (2010) [3] J. Smit, Physica (Amsterdam) 24, 39 (1958).