Regensburg 2013 – wissenschaftliches Programm
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 9: Poster: Interfaces and Thin Films (joint session with DECHEMA and VDI)
CPP 9.22: Poster
Montag, 11. März 2013, 17:30–19:30, Poster C
Real-time studies on annealing of Tetratetracontane (TTC) by X-Ray diffraction — •Linus Pithan1, Andreas Opitz1, Alexander Hinderhofer2, Eduard Meister3, Christian Frank2, Michael Kraus3, Wolfgang Brütting3, Frank Schreiber2, and Stefan Kowarik1 — 1Humboldt Universität Berlin — 2Universität Tübingen — 3Universität Augsburg
TTC (C44 H90) is e.g. used as dielectric interlayer in organic field-effect transistors [1]. For such devices large molecular grains with smooth surfaces are crucial. Here we report real time grazing incidence X-Ray diffraction (GIXD) measurements monitoring the annealing process of TTC thin films on silicon dioxide previously deposited by vapor deposition. Furthermore atomic force microscopy (AFM) and X-Ray reflectivity (XRR) results are presented. We find that randomly oriented and lying molecules on the surface rearrange into standing up molecules and fill subjacent layers [2]. By AFM measurements it can be shown that islands of molecules form large terraces in the annealing process.
[1] Kraus et al.; Organic Electronics, 12, 5, May 2011, 731-735, DOI:10.1016/j.orgel.2011.02.001
[2] Weber et al.; J. Chem. Phys. 136, 204709 (2012), DOI:10.1063/1.4719530