Dresden 2014 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 43: Poster II: Organic thin films; Atomic layer deposition, Thin film characterization: Structure analysis and composition (XRD, TEM, XPS, SIMS, RBS, ...)
DS 43.26: Poster
Donnerstag, 3. April 2014, 16:00–19:00, P1
Structural and magnetic properties of ultrathin epitaxial magnetite films grown on SrTiO3(001) — •Olga Schuckmann1, Nico Pathé1, Tobias Schemme1, Frederic Timmer1, Timo Kuschel2, Florian Bertram3, Karsten Küpper1, and Joachim Wollschläger1 — 1Osnabrück University, Germany — 2Bielefeld University, Germany — 3Lund University, Sweden
In this study, structural and magnetic properties of ultrathin magnetite (Fe3O4) films grown on SrTiO3 (STO) have been investigated. The films of thicknesses between 10 - 120 nm, as determined by x-ray reflectivity (XRR), were deposited on single crystalline niobium doped STO(100) substrates by reactive molecular beam epitaxy (RMBE, Fe evaporation in O2 atmosphere).
The stoichiometry of the oxide films was controlled by x-ray photoelectron spectroscopy (XPS). The film structure was characterized by high-energy surface x-ray diffraction (HESXRD) using 85 keV photons as well as lab based conventional XRD. The in-plane and out-of-plane lattice parameters show that compressive strain (-7.5 % lattice mismatch) is reduced with increasing film thickness.
In addition, the magnetic properties were studied by magnetooptic Kerr effect (MOKE) showing that the thickness and epitaxial strain affect the magnetic anisotropy of the films.