KR 12: Functional Materials - Analysis with EBSD, X-Ray Kossel Diffraction and Related Methods (MI jointly with KR)
Donnerstag, 3. April 2014, 09:30–11:00, MER 02
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09:30 |
KR 12.1 |
Hauptvortrag:
The martensitic transformation in Co-Ni-Al F-SMA — •Jaromír Kopeček, Karel Jurek, Michal Landa, and Oleg Heczko
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10:00 |
KR 12.2 |
Charakterisierung flächenhafter Inhomogenitäten in der ferromagnetischen Formgedächtnislegierung Co38Ni33Al29 mittels Kossel- und Pseudo-Kossel-Technik — Enrico Langer, Siegfried Däbritz, •Leonid P. Potapov, Katerina Kratka und Jaromír Kopeček
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10:15 |
KR 12.3 |
Strain inhomogeneities in epitaxial BaFe2As2 thin films measured by cross correlation electron backscatter diffraction — •Paul Chekhonin, Jan Engelmann, Bernhard Holzapfel, Carl-Georg Oertel, and Werner Skrotzki
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10:30 |
KR 12.4 |
Simulation of phase propagation delay for modulated EBIC in thin Silicon samples — •Markus Holla, Markus Ratzke, Winfried Seifert, and Martin Kittler
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10:45 |
KR 12.5 |
Characterization of 0-3 high permittivity composite capacitors for energy storage — •Jens Glenneberg, Gerald Wagner, Thomas Großmann, Stefan Ebbinghaus, Martin Diestelhorst, Sebastian Lemm, Horst Beige, and Hartmut Leipner
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