Berlin 2015 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 10: Thermoelectric materials
DS 10.4: Vortrag
Dienstag, 17. März 2015, 10:15–10:30, H 0111
Nanostructured SiGe thin films obtained through MIC processing — •Marc Lindorf1, Hartmut Rohrmann2, and Manfred Albrecht1 — 1University of Augsburg, Universitätsstraße 1, 86159 Augsburg, Germany — 2Oerlikon Advanced Technologies AG, Iramali 18, 9496 Balzers, Liechtenstein
In times of growing energy consumption thermoelectric devices pose an opportunity for energy harvesting. However commercially available thermoelectric materials show a deficit in efficiency governed by low ZT values. New approaches like nanostructuring [1] try to increase the efficiency, but often lack industrial applicability due to high cost and low production speed. This work presents results on sputter deposited multilayer stacks of Si80Ge20(10 nm)/[Al(dAl)/Si80Ge20(10 nm)]50/SiO2(200 nm)/Si. Crystallization and Al dopant activation is achieved by post-annealing through metal induced crystallization (MIC) [2]. This approach allows grain size control via annealing temperature and Al interlayer thickness dAl in the nanometer regime. Results will be presented regarding structural and thermoelectric properties.
[1] Y. Lan et al.,Adv. Funct. Mater. 20, 357-376 (2010).
[2] Z. M. Wang et al.,Phys. Rev. Lett. 100, 125503 (2008)