Berlin 2015 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
DS: Fachverband Dünne Schichten
DS 36: Poster Session I
DS 36.35: Poster
Donnerstag, 19. März 2015, 09:30–12:00, Poster A
RHEED-based investigations of (La2/3Sr1/3)xMnyOz thin film growth — •Alexandra Steffen1, Sabine Pütter1, Jürgen Schubert3, Stefan Mattauch1, Willi Zander3, Stefan Geprägs4, and Thomas Brückel1,2 — 1Jülich Centre for Neutron Science JCNS, Forschungszentrum Jülich GmbH, Outstation at MLZ, Lichtenbergstr. 1, 85748 Garching — 2Jülich Centre for Neutron Science JCNS und Peter Grünberg Institut PGI, JCNS-2, PGI-4: Scattering Methods, Forschungszentrum Jülich GmbH, 52425 Jülich — 3Peter Grünberg Institut PGI, PGI-9: Semiconductor Nanoelectronics, Forschungszentrum Jülich GmbH, 52425 Jülich — 4Walther-Meißner-Institut, Bayerische Akademie der Wissenschaften, 85748 Garching
In transition metal oxide thin films the Ruddlesden-Popper variants of classical perovskite materials are under intense investigation [1]. Here, we focus on a comparison of the relation between two different growth techniques onto in-situ Reflection of High-Energy Electron Diffraction (RHEED) measurements [2] of ferromagnetic (La2/3Sr1/3)xMnyOz. Semi-continuous deposition and atomic-layer-by-layer deposition was realized via oxide Molecular Beam Epitaxy. Control of the stoichiometry was monitored in-situ via quartz crystal balance and RHEED and ex-situ via Rutherford Backscattering Spectrometry (RBS). Via additional XRR, XRD and PNR measurements we combine different scattering methods to gain insight into the depth profile of the atomic positions. [1] V. Goian et al., Phys. Rev. B 90, 174105 (2014); [2] J. Haeni et al., Journal of Electroceramics 4, 385 (2000)