Berlin 2015 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 36: Poster Session I

DS 36.54: Poster

Donnerstag, 19. März 2015, 09:30–12:00, Poster A

critical current density scaling of FeSe0.5Te0.5 thin films on different substrates — •Feifei Yuan^1,2, Kazumasa Iida^2,3, Marco Langer², Jens Hänisch², Ataru Ichinose⁴, Ichiro Tsukada⁴, Alberto Sala⁵, Marina Putti⁵, Ruben Hühne², Ludwing Schultz², and Zhixiang Shi¹ — ¹Department of Physics and Key Laboratory of MEMS of the Ministry of Education, Southeast University, Nanjing, China — ²Institute for Metallic Materials, IFW Dresden, Dresden, Germany — ³Department of Crystalline Materials Science Graduate School of Engineering, Nagoya University, Nagoya, Japan — ⁴Central Research Institute of Electric Power Industry, 2-6-1 Nagasaka, Yokosuka, Kanagawa, Japan — ⁵Dipartimento di Fisica, Università di Genova, Via Dodecaneso, Genova, ItalyI

FeSe0.5Te0.5 thin films grown by pulsed laser deposition on CaF2, LaAlO3 (LAO) and MgO substrates were structurally and electro-magnetically characterized. The in-plane lattice mismatch between FeSe0.5Te0.5 and the substrates shows no influence on the lattice parameters of the films. While the type of the substrates, crystallinity and epitaxy of the films affect the superconducting properties. The film on MgO showed an extra peak in the angular dependence of Jc at θ=180°, which arises from c-axis defects as confirmed by transmission election microscopy. In contrast, no c-axis Jc(θ) peaks were observed in films on CaF2 and LAO. A successful scaling of the Jc(θ) can be realized for both films without c-axis correlated defects by the anisotropy ginzburg-landau (AGL)approach with appropriate anisotropy ratio γ.the AGL scaling parameter γ is decreasing with decreasing temperature.