Regensburg 2016 – wissenschaftliches Programm

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MI: Fachverband Mikrosonden

MI 4: Helium and Neon Ion Microscopy for the Analysis and Structuring on the Nanoscale

MI 4.3: Vortrag

Mittwoch, 9. März 2016, 15:30–15:45, H5

Writing nanoscale magnets with neon using a gas field ion source microscope — •Gregor Hlawacek¹, Anna Semisalova¹, Falk Röder², Sebastian Wintz¹, René Hübner¹, Lothar Bischoff¹, Hannes Lichte², Kay Potzger¹, Jürgen Lindner¹, Jürgen Fassbender¹, and Rantej Bali¹ — ¹Ion Beam Physics and Materials Research, Helmholz—Zentrum Dresden – Rossendorf, Bautzner Landstr. 400, 01328 Dresden, Germany — ²Triebenberg Labor, Institut für Strukturphysik, Technische Universität Dresden, 01062 Dresden, Germany

Gas field ion source (GFIS) based microscopy—historically called Helium Ion Microscopy (HIM)—provides the unique ability to structure material on the nano-scale using an ion beam with a diameter of less than 5 Å. Usually high fluences of the relatively light noble gases are needed to change the shape, or induce property changes in the target structure. Here, we present a method that allows to create arbitrary shaped magnets in a Fe₆₀Al₄₀ alloy using fluences of only a few neon ions per square nanometer. Using neon chemical disorder can be introduced into the paramagnetic B2 phase of the alloy. The increase in Fe–Fe nearest neighbors results in a switch to ferromagnetism in the irradiated area. We will discuss the achievable minimal size (<50 nm) and the in–depth thickness of the magnets (15 nm–60 nm). X-rays, TEM and MFM have been used for characterization.

[1] G. Hlawacek et al., J. Vac. Sci. Technol. B, 32(2):020801, 2014. [2] F. Röder et al., Sci. Rep., 5:16786, 2015. [3] R. Bali et al. Nano Lett., 14(2):435, 2014.