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Regensburg 2016 – scientific programme

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MI: Fachverband Mikrosonden

MI 5: Scanning Probe Microscopy

Wednesday, March 9, 2016, 16:00–16:45, H5

16:00 MI 5.1 Contrast of nonlinear response in atomic force microscopy — •Daniel Forchheimer, Robert Forchheimer, and David Haviland
16:15 MI 5.2 Liquid helium free scanning probe microscope working at below 10 K — •Byoung Choi
16:30 MI 5.3 Fast-scanning and quantitative-imaging atomic force microscopy (AFM) combined with advanced optical techniques — •Elmar Hartmann, Dimitar R. Stamov, and Torsten Jähnke
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